The system is based on the application of three AI techniques such as engineering ontology (EO), GA and ants colony optimization (ACO). This paper presents a developed inspection planning system based on CMM as support of the smart metrology within Industry 4.0 or manufacturing metrology 4.0 (MM4.0). Industry 4.0 represents a new paradigm which creates new requirements in the area of manufacturing and manufacturing metrology such as to reduce the cost of product, flexibility, mass customization, quality of product, high level of digitalization, optimization, etc., all of which contribute to smart manufacturing and smart metrology systems.
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